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Mass characterization of multi-pixel photon counters for the T2K 280 m near detector

  • F. Moreau
  • , J. C. Vanel
  • , O. Drapier
  • , M. Gonin
  • , A. Bonnemaison
  • , A. Cauchois
  • , Y. Geerebaert
  • , S. Couturier-Le Quellec

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A few thousands multi-pixel photon counters (MPPC) have been characterized for the T2K 280 m near detector (ND280). For this purpose a test facility has been developed enabling the characterization of 128 MPPC per day. A mean gain value of 5.4×105 at breakdown voltage (Vbreak)+1 V with a dispersion of 2.6% has been measured at 20 °C. It is shown that the accuracy of the test facility for the gain measurement is at the level of 0.76%. At 20 °C the dark noise rates (DNR) have been measured in a range from ∼400 up to ∼730 kHz at Vbreak+1.6 V.

Original languageEnglish
Pages (from-to)46-53
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume613
Issue number1
DOIs
Publication statusPublished - 21 Jan 2010

Keywords

  • APD
  • Geiger-mode
  • MPPC
  • Mass production
  • Photodetector
  • Quality control

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