Measurement of the time-resolved X-ray emission of different elements irradiated with a subpicosecond high-power laser

  • C. Chenais-Popovics
  • , P. Audebert
  • , V. Nagels
  • , J. P. Geindre
  • , J. C. Gauthier
  • , S. Gary
  • , F. Girard
  • , F. Dorchies
  • , R. Shepherd
  • , O. Peyrusse

Research output: Contribution to journalConference articlepeer-review

Abstract

X-ray spectra of a few picosecond duration were emitted by aluminum, selenium and samarium thin foils irradiated with a 100 TW, 300 fs laser at 0.53 μm wavelength. They were measured in the 1600 eV range with high temporal and spectral resolution, using a high-speed streak camera coupled to a conical Bragg crystal. Gradients were limited by using thin foils (300 to 800 Å) deposited on a 50 μm gold pinhole. Frequency Domain Interferometry was set to measure the velocity of the critical density at the rear of the target and deduce the electron temperature. A few picosecond duration X-ray spectra have been measured. Sm spectra showed no spectral features in the measured wavelength range, providing a spectrally homogeneous backlighter for absorption spectroscopy. The duration of the emission was shorter when observed through a pinhole. 1-D hydrodynamic simulations coupled to an atomic collisional-radiative code have been used to simulate the X-ray emission of aluminum. The main features of the experimental time resolved spectra, obtained for the pinhole target have been well reproduced, for an initial temperature of 700±100 eV.

Original languageEnglish
Pages (from-to)205-212
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5196
DOIs
Publication statusPublished - 3 May 2004
EventLaser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications - San Diego, CA, United States
Duration: 4 Aug 20036 Aug 2003

Keywords

  • Frequency Domain Interferometry
  • Subpicosecond laser plasma
  • Time-resolved X-ray spectroscopy

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