Abstract
The behavior of ortho-positronium (o-Ps) in mesoporous silica films implanted with low-energy positrons has been studied as a function of the film porous volume fraction. A lifetime spectrometer allowed determination of o-Ps annihilation decay both inside and outside of the film. A kinetic model is introduced that permits the determination of the yield and rate of escape of o-Ps into vacuum as well as the annihilation decay rate of the trapped o-Ps in the film. It is shown that these undergo a sudden change at a threshold porous volume fraction, above which the o-Ps escape rate to vacuum varies linearly with volume fraction.
| Original language | English |
|---|---|
| Article number | 124103 |
| Journal | Applied Physics Letters |
| Volume | 95 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 1 Jan 2009 |
| Externally published | Yes |
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