Metric Learning for Fingerprint RSSI-Localization

  • Kevin Elgui
  • , Pascal Bianchi
  • , Olivier Isson
  • , Francois Portier
  • , Renaud Marty

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we describe a framework dedicated to the geolocation of devices that can only be positioned in a set of specific locations called points of interest (noted PoIs). After a short introduction explaining the importance of this topic, a machine learning approach of this problem will be formalized and some of the off-the-shelf predictors that can be used to solve this geolocation problem will be discussed. Based on this review, the k-nearest neighbors (k-NN) method appears interesting for business applications due to its simplicity and reasonable effectiveness. We will then show that a gradient boosting metric learning enables to improve the k-NN weights and therefore leads to better performances with respect to the classical Euclidean distance choice for the similarity metric. We will discuss the effectiveness of this approach in our case consisting of a RSSI-localization task in high a dimensional space.

Original languageEnglish
Title of host publication2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1036-1042
Number of pages7
ISBN (Electronic)9781728102443
DOIs
Publication statusPublished - 1 Apr 2020
Event2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020 - Portland, United States
Duration: 20 Apr 202023 Apr 2020

Publication series

Name2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020

Conference

Conference2020 IEEE/ION Position, Location and Navigation Symposium, PLANS 2020
Country/TerritoryUnited States
CityPortland
Period20/04/2023/04/20

Keywords

  • classification
  • gradient boosting
  • k-nearest neighbors
  • logistic regression
  • metric learning
  • random forest

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