Metrological analysis of the DIC ultimate error regime

  • M. Bornert
  • , P. Doumalin
  • , J. C. Dupré
  • , C. Poilâne
  • , L. Robert
  • , E. Toussaint
  • , B. Wattrisse

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In DIC, the “ultimate error regime” corresponds to situations for which the shape function used to describe the material transformation perfectly matches the actual one. We propose to confront results obtained from numerically-shifted images with the predictions of theoretical models developed in the literature to describe bias and random error evolutions with respect to the imposed displacement. Results show the overall good predictions of these models but small deviations arise, mainly around integer values of imposed displacements for noisy images. These deviations are interpreted as the unrepresentativeness of the underlying hypotheses of the theoretical models in these particular cases.

Original languageEnglish
Title of host publicationConference Proceedings of the Society for Experimental Mechanics Series
EditorsMichael Sutton, Phillip L. Reu
PublisherSpringer Science and Business Media, LLC
Pages191-193
Number of pages3
ISBN (Print)9783319514383, 9783319746418
DOIs
Publication statusPublished - 1 Jan 2017
Event1st Annual International Digital Imaging Correlation Society, 2016 - Philadelphia, United States
Duration: 7 Nov 201610 Nov 2016

Publication series

NameConference Proceedings of the Society for Experimental Mechanics Series
Volume0
ISSN (Print)2191-5644
ISSN (Electronic)2191-5652

Conference

Conference1st Annual International Digital Imaging Correlation Society, 2016
Country/TerritoryUnited States
CityPhiladelphia
Period7/11/1610/11/16

Keywords

  • Digital image correlation
  • Metrology
  • Ultimate error

Fingerprint

Dive into the research topics of 'Metrological analysis of the DIC ultimate error regime'. Together they form a unique fingerprint.

Cite this