Microstructure and strain relaxation in YBa2Cu3O7 epitaxial thin films

J. L. Maurice; O. Durand; M. Drouet; J. P. Contour

doi:10.1016/S0040-6090(97)01124-3

Microstructure and strain relaxation in YBa₂Cu₃O₇ epitaxial thin films

J. L. Maurice, O. Durand, M. Drouet, J. P. Contour

Thales Group

Research output: Contribution to journal › Article › peer-review

Abstract

We present X-ray diffraction (XRD) and transmission electron microscopy (TEM) observations of microstructure and strain relaxation in YBa₂Cu₃O₇ (YBCO) thin films grown on SrTiO₃ (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We discuss the respective roles of twins and dislocations in the relaxation process.

Original language	English
Pages (from-to)	211-214
Number of pages	4
Journal	Thin Solid Films
Volume	319
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(97)01124-3
Publication status	Published - 29 Apr 1998
Externally published	Yes

Keywords

Dislocations
Epitaxial thin films
Microstructure
Strain relaxation

Access to Document

10.1016/S0040-6090(97)01124-3

Cite this

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title = "Microstructure and strain relaxation in YBa2Cu3O7 epitaxial thin films",

abstract = "We present X-ray diffraction (XRD) and transmission electron microscopy (TEM) observations of microstructure and strain relaxation in YBa2Cu3O7 (YBCO) thin films grown on SrTiO3 (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We discuss the respective roles of twins and dislocations in the relaxation process.",

keywords = "Dislocations, Epitaxial thin films, Microstructure, Strain relaxation",

author = "Maurice, \{J. L.\} and O. Durand and M. Drouet and Contour, \{J. P.\}",

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AU - Maurice, J. L.

AU - Durand, O.

AU - Drouet, M.

AU - Contour, J. P.

PY - 1998/4/29

Y1 - 1998/4/29

N2 - We present X-ray diffraction (XRD) and transmission electron microscopy (TEM) observations of microstructure and strain relaxation in YBa2Cu3O7 (YBCO) thin films grown on SrTiO3 (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We discuss the respective roles of twins and dislocations in the relaxation process.

AB - We present X-ray diffraction (XRD) and transmission electron microscopy (TEM) observations of microstructure and strain relaxation in YBa2Cu3O7 (YBCO) thin films grown on SrTiO3 (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We discuss the respective roles of twins and dislocations in the relaxation process.

KW - Dislocations

KW - Epitaxial thin films

KW - Microstructure

KW - Strain relaxation

U2 - 10.1016/S0040-6090(97)01124-3

DO - 10.1016/S0040-6090(97)01124-3

M3 - Article

AN - SCOPUS:0032047208

SN - 0040-6090

VL - 319

SP - 211

EP - 214

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2