TY - GEN
T1 - Mining bias-target Alignment from Voronoi Cells
AU - Nahon, Rémi
AU - Nguyen, Van Tam
AU - Tartaglione, Enzo
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023/1/1
Y1 - 2023/1/1
N2 - Despite significant research efforts, deep neural networks remain vulnerable to biases: this raises concerns about their fairness and limits their generalization. In this paper, we propose a bias-agnostic approach to mitigate the impact of biases in deep neural networks. Unlike traditional debiasing approaches, we rely on a metric to quantify "bias alignment/misalignment"on target classes and use this information to discourage the propagation of bias-target alignment information through the network. We conduct experiments on several commonly used datasets for debiasing and compare our method with supervised and bias-specific approaches. Our results indicate that the proposed method achieves comparable performance to state-of-the-art supervised approaches, despite being bias-agnostic, even in the presence of multiple biases in the same sample.
AB - Despite significant research efforts, deep neural networks remain vulnerable to biases: this raises concerns about their fairness and limits their generalization. In this paper, we propose a bias-agnostic approach to mitigate the impact of biases in deep neural networks. Unlike traditional debiasing approaches, we rely on a metric to quantify "bias alignment/misalignment"on target classes and use this information to discourage the propagation of bias-target alignment information through the network. We conduct experiments on several commonly used datasets for debiasing and compare our method with supervised and bias-specific approaches. Our results indicate that the proposed method achieves comparable performance to state-of-the-art supervised approaches, despite being bias-agnostic, even in the presence of multiple biases in the same sample.
U2 - 10.1109/ICCV51070.2023.00456
DO - 10.1109/ICCV51070.2023.00456
M3 - Conference contribution
AN - SCOPUS:85185868674
T3 - Proceedings of the IEEE International Conference on Computer Vision
SP - 4923
EP - 4932
BT - Proceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Y2 - 2 October 2023 through 6 October 2023
ER -