Model dielectric function of amorphous materials including Urbach tail

M. Foldyna; K. Postava; J. Bouchala; J. Pištora; T. Yamaguchi

doi:10.1117/12.560673

Model dielectric function of amorphous materials including Urbach tail

M. Foldyna
, K. Postava
, J. Bouchala
, J. Pištora
, T. Yamaguchi

Technical University Ostrava
Shizuoka University

Research output: Contribution to journal › Conference article › peer-review

Abstract

A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

Original language	English
Pages (from-to)	301-305
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5445
DOIs	https://doi.org/10.1117/12.560673
Publication status	Published - 6 Jul 2004
Externally published	Yes
Event	Microwave and Optical Technology 2003 - Ostrava, Czech Republic Duration: 11 Aug 2003 → 15 Aug 2003

Keywords

Amorphous materials
Model dielectric function
Spectroscopic ellipsometry
Tauc-Lorentz model
Urbach tail

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10.1117/12.560673

Cite this

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title = "Model dielectric function of amorphous materials including Urbach tail",

abstract = "A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Kr{\"o}nig dispersion relations. The model is applied to hydrogenated amorphous silicon.",

keywords = "Amorphous materials, Model dielectric function, Spectroscopic ellipsometry, Tauc-Lorentz model, Urbach tail",

author = "M. Foldyna and K. Postava and J. Bouchala and J. Pi{\v s}tora and T. Yamaguchi",

year = "2004",

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language = "English",

volume = "5445",

pages = "301--305",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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note = "Microwave and Optical Technology 2003 ; Conference date: 11-08-2003 Through 15-08-2003",

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TY - JOUR

T1 - Model dielectric function of amorphous materials including Urbach tail

AU - Foldyna, M.

AU - Postava, K.

AU - Bouchala, J.

AU - Pištora, J.

AU - Yamaguchi, T.

PY - 2004/7/6

Y1 - 2004/7/6

N2 - A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

AB - A generalization of the Tauc-Lorentz model dielectric function of amorphous semiconductors and dielectrics is presented in which the exponential Urbach tail is included. The generalized parametrization of the optical functions includes only six fitting parameters. The real part of the dielectric function is calculated using analytical Kramers-Krönig dispersion relations. The model is applied to hydrogenated amorphous silicon.

KW - Amorphous materials

KW - Model dielectric function

KW - Spectroscopic ellipsometry

KW - Tauc-Lorentz model

KW - Urbach tail

U2 - 10.1117/12.560673

DO - 10.1117/12.560673

M3 - Conference article

AN - SCOPUS:3042682283

SN - 0277-786X

VL - 5445

SP - 301

EP - 305

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Microwave and Optical Technology 2003

Y2 - 11 August 2003 through 15 August 2003

ER -

Model dielectric function of amorphous materials including Urbach tail

Abstract

Keywords

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