Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Thomas A. Germer; Martin Foldyna; Zuzana Mrazkova; Guillaume Fischerc; Etienne Drahice

doi:10.1117/12.2236976

Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Thomas A. Germer
, Martin Foldyna
, Zuzana Mrazkova
, Guillaume Fischerc
, Etienne Drahice

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

Original language	English
Title of host publication	Reflection, Scattering, and Diffraction from Surfaces V
Editors	Leonard M. Hanssen
Publisher	SPIE
ISBN (Electronic)	9781510603134
DOIs	https://doi.org/10.1117/12.2236976
Publication status	Published - 1 Jan 2016
Event	Reflection, Scattering, and Diffraction from Surfaces V - San Diego, United States Duration: 28 Aug 2016 → 29 Aug 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9961
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Reflection, Scattering, and Diffraction from Surfaces V
Country/Territory	United States
City	San Diego
Period	28/08/16 → 29/08/16

Keywords

BRDF
Mueller matrix
Photovoltaics
Pyramids
Scattering
Surface texture

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1117/12.2236976

Cite this

Germer, T. A., Foldyna, M., Mrazkova, Z., Fischerc, G., & Drahice, E. (2016). Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces. In L. M. Hanssen (Ed.), Reflection, Scattering, and Diffraction from Surfaces V Article 996107 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9961). SPIE. https://doi.org/10.1117/12.2236976

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title = "Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces",

abstract = "Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.",

keywords = "BRDF, Mueller matrix, Photovoltaics, Pyramids, Scattering, Surface texture",

author = "Germer, \{Thomas A.\} and Martin Foldyna and Zuzana Mrazkova and Guillaume Fischerc and Etienne Drahice",

note = "Publisher Copyright: {\textcopyright} 2016 SPIE.; Reflection, Scattering, and Diffraction from Surfaces V ; Conference date: 28-08-2016 Through 29-08-2016",

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doi = "10.1117/12.2236976",

language = "English",

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Germer, TA, Foldyna, M, Mrazkova, Z, Fischerc, G & Drahice, E 2016, Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces. in LM Hanssen (ed.), Reflection, Scattering, and Diffraction from Surfaces V., 996107, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9961, SPIE, Reflection, Scattering, and Diffraction from Surfaces V, San Diego, United States, 28/08/16. https://doi.org/10.1117/12.2236976

Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces. / Germer, Thomas A.; Foldyna, Martin; Mrazkova, Zuzana et al.
Reflection, Scattering, and Diffraction from Surfaces V. ed. / Leonard M. Hanssen. SPIE, 2016. 996107 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9961).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

AU - Germer, Thomas A.

AU - Foldyna, Martin

AU - Mrazkova, Zuzana

AU - Fischerc, Guillaume

AU - Drahice, Etienne

PY - 2016/1/1

Y1 - 2016/1/1

N2 - Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

AB - Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.

KW - BRDF

KW - Mueller matrix

KW - Photovoltaics

KW - Pyramids

KW - Scattering

KW - Surface texture

U2 - 10.1117/12.2236976

DO - 10.1117/12.2236976

M3 - Conference contribution

AN - SCOPUS:85007022100

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Reflection, Scattering, and Diffraction from Surfaces V

A2 - Hanssen, Leonard M.

PB - SPIE

T2 - Reflection, Scattering, and Diffraction from Surfaces V

Y2 - 28 August 2016 through 29 August 2016

ER -

Germer TA, Foldyna M, Mrazkova Z, Fischerc G, Drahice E. Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces. In Hanssen LM, editor, Reflection, Scattering, and Diffraction from Surfaces V. SPIE. 2016. 996107. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2236976

Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Abstract

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Conference

Keywords

UN SDGs

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