Multi-dimensional luminescence imaging: Accessing transport properties

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Among all the characterization methods in the photovoltaic research area the luminescence luminescence-based ones offer multiple advantages. Indeed, it is possible to analyze both photovoltaic materials and devices in a quantitative way since the luminescence signals are linked to several photovoltaic conversion mechanisms such as the voltage generation, charge extraction or diffusion length. Here we use imaging methods to probe the transport properties and/or image material inhomogeneities. By using multi multi-dimensional imaging systems, we show how we can broaden the range of determined optoelectronic properties. A focus is made on transport properties applied to multiple PV absorbers.

Original languageEnglish
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3423-3426
Number of pages4
ISBN (Electronic)9781728104942
DOIs
Publication statusPublished - 1 Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period16/06/1921/06/19

Keywords

  • hyperspectral
  • modelling
  • photoluminescence
  • semiconductors
  • transient

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