Multi-label Classification with Meta-Labels

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The area of multi-label classification has rapidly developed in recent years. It has become widely known that the baseline binary relevance approach can easily be outperformed by methods which learn labels together. A number of methods have grown around the label power set approach, which models label combinations together as class values in a multi-class problem. We describe the label-power set-based solutions under a general framework of meta-labels and provide some theoretical justification for this framework which has been lacking, explaining how meta-labels essentially allow a random projection into a space where non-linearities can easily be tackled with established linear learning algorithms. The proposed framework enables comparison and combination of related approaches to different multi-label problems. We present a novel model in the framework and evaluate it empirically against several high-performing methods, with respect to predictive performance and scalability, on a number of datasets and evaluation metrics. This deployment obtains competitive accuracy for a fraction of the computation required by the current meta-label methods for multi-label classification.

Original languageEnglish
Title of host publicationProceedings - 14th IEEE International Conference on Data Mining, ICDM 2014
EditorsRavi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages941-946
Number of pages6
EditionJanuary
ISBN (Electronic)9781479943029
DOIs
Publication statusPublished - 1 Jan 2014
Externally publishedYes
Event14th IEEE International Conference on Data Mining, ICDM 2014 - Shenzhen, China
Duration: 14 Dec 201417 Dec 2014

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
NumberJanuary
Volume2015-January
ISSN (Print)1550-4786

Conference

Conference14th IEEE International Conference on Data Mining, ICDM 2014
Country/TerritoryChina
CityShenzhen
Period14/12/1417/12/14

Keywords

  • classification
  • multi-label

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