TY - GEN
T1 - Multiscale line segment detector for robust and accurate SfM
AU - Salaun, Yohann
AU - Marlet, Renaud
AU - Monasse, Pascal
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - We propose a multiscale extension of a well-known line segment detector, LSD. We show that its multiscale nature makes it much less prone to over-segmentation, more robust to low contrast and less sensitive to noise, while keeping the parameterless advantage of LSD and still being fast. Moreover, we show that in scenes with little or no feature points, but where it is however possible to perform structure from motion from matched line segments, the accuracy is significantly improved. This provides an objective and automatic quantitative assessment of our detector that goes much beyond the usual qualitative visual inspection found in the literature.
AB - We propose a multiscale extension of a well-known line segment detector, LSD. We show that its multiscale nature makes it much less prone to over-segmentation, more robust to low contrast and less sensitive to noise, while keeping the parameterless advantage of LSD and still being fast. Moreover, we show that in scenes with little or no feature points, but where it is however possible to perform structure from motion from matched line segments, the accuracy is significantly improved. This provides an objective and automatic quantitative assessment of our detector that goes much beyond the usual qualitative visual inspection found in the literature.
UR - https://www.scopus.com/pages/publications/84990021750
U2 - 10.1109/ICPR.2016.7899930
DO - 10.1109/ICPR.2016.7899930
M3 - Conference contribution
AN - SCOPUS:84990021750
T3 - Proceedings - International Conference on Pattern Recognition
SP - 2000
EP - 2005
BT - 2016 23rd International Conference on Pattern Recognition, ICPR 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd International Conference on Pattern Recognition, ICPR 2016
Y2 - 4 December 2016 through 8 December 2016
ER -