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N-atom production at high electric fields: E-FISH and TALIF experiments for understanding fast ionization wave kinetics

  • Sorbonne Univ.
  • The Ohio State University
  • Moscow State University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This work forms part of a larger effort to develop a suite of diagnostics for making measurements in non-equilibrium, nanosecond pulse discharges, so as to facilitate an improved understanding of the plasma kinetics. Electric field induced second harmonic (E-FISH) generation, is used to probe the electric field in a fast ionization wave, nanosecond pulse discharge in pure N2 at a pressure of 20 mbar. The field evolution during the fast ionization wave development is clearly captured in the form of three distinct phases. An initial field overshoot ahead of the front to about 10.5 kV/cm (or about 2 kTd), followed by a field drop as the wave traverses the measurement location, and finally a subsequent rise as a quasi-steady state regime is established. TALIF measurements of N-atom density are also performed with a view to understanding the impact of the reduced electric field on the consequent atomic species production. These measurements are limited to the post-discharge phase, mainly due to the poor signal to raise ratio associated with the lower atomic densities and strong fluorescence-overlapping plasma emission. A relatively low peak N-atom density of about 5.5 x 1012 cm-3 is obtained, in line with the low specific deposited energy of this discharge (0.01 eV/molecule). Finally, attempts to model this plasma show that the results of simulations are strongly influenced by the radial non-uniformity of the discharge.

Original languageEnglish
Title of host publicationAIAA Scitech 2020 Forum
PublisherAmerican Institute of Aeronautics and Astronautics Inc, AIAA
ISBN (Print)9781624105951
DOIs
Publication statusPublished - 1 Jan 2020
Externally publishedYes
EventAIAA Scitech Forum, 2020 - Orlando, United States
Duration: 6 Jan 202010 Jan 2020

Publication series

NameAIAA Scitech 2020 Forum
Volume1 PartF

Conference

ConferenceAIAA Scitech Forum, 2020
Country/TerritoryUnited States
CityOrlando
Period6/01/2010/01/20

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