Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz

C. Klieber; E. Peronne; K. Katayama; J. Choi; M. Yamaguchi; T. Pezeril; Keith A. Nelson

doi:10.1063/1.3595275

Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz

C. Klieber
, E. Peronne
, K. Katayama
, J. Choi
, M. Yamaguchi
, T. Pezeril
, Keith A. Nelson

Department of Chemistry
Massachusetts Institute of Technology
CNRS, UMR 7588, INSP
Dept. Appl. Chem.
Chuo University
Dept. of Physics
Rensselaer Polytechnic Institute
Le Mans Université

Research output: Contribution to journal › Article › peer-review

48 Citations (Scopus)

Abstract

Acoustic attenuation rates in vitreous silica in the 20-400 GHz frequency range have been measured using a multiple-pulse optical technique for generation of tunable multicycle acoustic waves that are detected interferometrically after traversal of the sample. The results connect the frequency ranges of several measurement methods, yielding a consistent description of the acoustic behavior.

Original language	English
Article number	211908
Journal	Applied Physics Letters
Volume	98
Issue number	21
DOIs	https://doi.org/10.1063/1.3595275
Publication status	Published - 23 May 2011
Externally published	Yes

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title = "Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz",

abstract = "Acoustic attenuation rates in vitreous silica in the 20-400 GHz frequency range have been measured using a multiple-pulse optical technique for generation of tunable multicycle acoustic waves that are detected interferometrically after traversal of the sample. The results connect the frequency ranges of several measurement methods, yielding a consistent description of the acoustic behavior.",

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AU - Klieber, C.

AU - Peronne, E.

AU - Katayama, K.

AU - Choi, J.

AU - Yamaguchi, M.

AU - Pezeril, T.

AU - Nelson, Keith A.

PY - 2011/5/23

Y1 - 2011/5/23

N2 - Acoustic attenuation rates in vitreous silica in the 20-400 GHz frequency range have been measured using a multiple-pulse optical technique for generation of tunable multicycle acoustic waves that are detected interferometrically after traversal of the sample. The results connect the frequency ranges of several measurement methods, yielding a consistent description of the acoustic behavior.

AB - Acoustic attenuation rates in vitreous silica in the 20-400 GHz frequency range have been measured using a multiple-pulse optical technique for generation of tunable multicycle acoustic waves that are detected interferometrically after traversal of the sample. The results connect the frequency ranges of several measurement methods, yielding a consistent description of the acoustic behavior.

U2 - 10.1063/1.3595275

DO - 10.1063/1.3595275

M3 - Article

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SN - 0003-6951

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 21

M1 - 211908

ER -

Narrow-band acoustic attenuation measurements in vitreous silica at frequencies between 20 and 400 GHz

Abstract

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