New Methodology for Anisotropic Nanoparticles Characterization by Depolarized Light Scattering Measurements: Length and Diameter Determination of Rod-Like Nanoparticles

  • Benoit Maxit
  • , Clara Catros
  • , Julien Le Mener
  • , Florian Aubrit
  • , Olivier Sandre
  • , David Jacob
  • , Sylvain Boj

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we introduce a new setup and a method for characterizing anisotropic nanoparticles using a multi-angle polarization dynamic light scattering technique. This method is based on the measurement of the correlograms of scattered light intensity fluctuations both in the parallel and crossed polarizer configurations, and possibly concomitantly, from which the rotational and translational diffusion coefficients are extracted. By inversing the mathematical expressions of these coefficients, this approach allows the rapid determination of length and diameter of the anisotropic nanoparticles, enabling kinetic measurements. A comparison of experimental results obtained with this multi-angle depolarized DLS (DDLS) method to classical TEM images is discussed.

Original languageEnglish
Title of host publication2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024
EditorsCor Claeys, Beichao Zhang, Bin Yu, Ru Huang, Xiaowei Li, Steve X. Liang, Jianshi Tang, Hsiang-Lan Lung, Linyong Pang, Weikang Qian, Xinping Qu, Xiaoping Shi, Ying Zhang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350362190
DOIs
Publication statusPublished - 1 Jan 2024
Event2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024 - Shanghai, China
Duration: 17 Mar 202418 Mar 2024

Publication series

Name2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024

Conference

Conference2024 Conference of Science and Technology for Integrated Circuits, CSTIC 2024
Country/TerritoryChina
CityShanghai
Period17/03/2418/03/24

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