New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

Ph Zeitoun; Ph Balcou; S. Bucourt; D. Benredjem; F. Delmotte; G. Dovillaire; D. Douillet; J. Dunn; G. Faivre; M. Fajardo; K. A. Goldberg; M. Idir; S. Hubert; J. R. Hunter; S. Jacquemot; S. Kazamias; S. Le Pape; X. Levecq; C. L.S. Lewis; R. Marmoret; P. Mercère; A. S. Morlens; P. P. Naulleau; C. Rémond; J. J. Rocca; S. Sebban; R. F. Smith; M. F. Ravet; P. Troussel; C. Valentin; L. Vanbostal

doi:10.1117/12.508183

New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

Ph Zeitoun
, Ph Balcou
, S. Bucourt
, D. Benredjem
, F. Delmotte
, G. Dovillaire
, D. Douillet
, J. Dunn
, G. Faivre
, M. Fajardo
, K. A. Goldberg
, M. Idir
, S. Hubert
, J. R. Hunter
, S. Jacquemot
, S. Kazamias
, S. Le Pape
, X. Levecq
, C. L.S. Lewis
, R. Marmoret

P. Mercère, A. S. Morlens, P. P. Naulleau, C. Rémond, J. J. Rocca, S. Sebban, R. F. Smith, M. F. Ravet, P. Troussel, C. Valentin, L. Vanbostal

Research output: Contribution to journal › Conference article › peer-review

Abstract

Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ∼10^-6). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*10¹⁴ Wcm^-2 by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.

Original language	English
Pages (from-to)	194-204
Number of pages	11
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5197
DOIs	https://doi.org/10.1117/12.508183
Publication status	Published - 1 Jan 2003
Externally published	Yes
Event	Soft X-Ray Lasers and Applications V - San Diego, CA, United States Duration: 6 Aug 2003 → 7 Aug 2003

Keywords

EUV optics
Longitudinal coherence
Michelson soft x-ray interferometry
X-ray laser

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10.1117/12.508183

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Zeitoun, P., Balcou, P., Bucourt, S., Benredjem, D., Delmotte, F., Dovillaire, G., Douillet, D., Dunn, J., Faivre, G., Fajardo, M., Goldberg, K. A., Idir, M., Hubert, S., Hunter, J. R., Jacquemot, S., Kazamias, S., Le Pape, S., Levecq, X., Lewis, C. L. S., ... Vanbostal, L. (2003). New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality. Proceedings of SPIE - The International Society for Optical Engineering, 5197, 194-204. https://doi.org/10.1117/12.508183

@article{450a59bff227408e94c671741bcaf7b6,

title = "New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality",

abstract = "Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ∼10-6). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*1014 Wcm-2 by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.",

keywords = "EUV optics, Longitudinal coherence, Michelson soft x-ray interferometry, X-ray laser",

author = "Ph Zeitoun and Ph Balcou and S. Bucourt and D. Benredjem and F. Delmotte and G. Dovillaire and D. Douillet and J. Dunn and G. Faivre and M. Fajardo and Goldberg, \{K. A.\} and M. Idir and S. Hubert and Hunter, \{J. R.\} and S. Jacquemot and S. Kazamias and \{Le Pape\}, S. and X. Levecq and Lewis, \{C. L.S.\} and R. Marmoret and P. Merc{\`e}re and Morlens, \{A. S.\} and Naulleau, \{P. P.\} and C. R{\'e}mond and Rocca, \{J. J.\} and S. Sebban and Smith, \{R. F.\} and Ravet, \{M. F.\} and P. Troussel and C. Valentin and L. Vanbostal",

year = "2003",

month = jan,

day = "1",

doi = "10.1117/12.508183",

language = "English",

volume = "5197",

pages = "194--204",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "Soft X-Ray Lasers and Applications V ; Conference date: 06-08-2003 Through 07-08-2003",

}

Zeitoun, P, Balcou, P, Bucourt, S, Benredjem, D, Delmotte, F, Dovillaire, G, Douillet, D, Dunn, J, Faivre, G, Fajardo, M, Goldberg, KA, Idir, M, Hubert, S, Hunter, JR, Jacquemot, S, Kazamias, S, Le Pape, S, Levecq, X, Lewis, CLS, Marmoret, R, Mercère, P, Morlens, AS, Naulleau, PP, Rémond, C, Rocca, JJ, Sebban, S, Smith, RF, Ravet, MF, Troussel, P, Valentin, C & Vanbostal, L 2003, 'New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality', Proceedings of SPIE - The International Society for Optical Engineering, vol. 5197, pp. 194-204. https://doi.org/10.1117/12.508183

TY - JOUR

T1 - New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

AU - Zeitoun, Ph

AU - Balcou, Ph

AU - Bucourt, S.

AU - Benredjem, D.

AU - Delmotte, F.

AU - Dovillaire, G.

AU - Douillet, D.

AU - Dunn, J.

AU - Faivre, G.

AU - Fajardo, M.

AU - Goldberg, K. A.

AU - Idir, M.

AU - Hubert, S.

AU - Hunter, J. R.

AU - Jacquemot, S.

AU - Kazamias, S.

AU - Le Pape, S.

AU - Levecq, X.

AU - Lewis, C. L.S.

AU - Marmoret, R.

AU - Mercère, P.

AU - Morlens, A. S.

AU - Naulleau, P. P.

AU - Rémond, C.

AU - Rocca, J. J.

AU - Sebban, S.

AU - Smith, R. F.

AU - Ravet, M. F.

AU - Troussel, P.

AU - Valentin, C.

AU - Vanbostal, L.

PY - 2003/1/1

Y1 - 2003/1/1

N2 - Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ∼10-6). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*1014 Wcm-2 by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.

AB - Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ∼10-6). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*1014 Wcm-2 by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.

KW - EUV optics

KW - Longitudinal coherence

KW - Michelson soft x-ray interferometry

KW - X-ray laser

UR - https://www.scopus.com/pages/publications/11144356055

U2 - 10.1117/12.508183

DO - 10.1117/12.508183

M3 - Conference article

AN - SCOPUS:11144356055

SN - 0277-786X

VL - 5197

SP - 194

EP - 204

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Soft X-Ray Lasers and Applications V

Y2 - 6 August 2003 through 7 August 2003

ER -

New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

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Keywords

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