New Valid Inequalities for a Multi-echelon Multi-item Lot-Sizing Problem with Returns and Lost Sales

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This work studies a multi-echelon multi-item lot-sizing problem with remanufacturing and lost sales. The problem is formulated as a mixed-integer linear program. A new family of valid inequalities taking advantage of the problem structure is introduced and used in a customized branch-and-cut algorithm. The provided numerical results show that the proposed algorithm outperforms both the generic branch-and-cut algorithm embedded in a standard-alone mathematical solver and a previously published customized branch-and-cut algorithm.

Original languageEnglish
Title of host publicationComputational Logistics - 12th International Conference, ICCL 2021, Proceedings
EditorsMartijn Mes, Eduardo Lalla-Ruiz, Stefan Voß
PublisherSpringer Science and Business Media Deutschland GmbH
Pages192-207
Number of pages16
ISBN (Print)9783030876715
DOIs
Publication statusPublished - 1 Jan 2021
Event12th International Conference on Computational Logistics, ICCL 2021 - Virtual, Online
Duration: 27 Sept 202129 Sept 2021

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume13004 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference12th International Conference on Computational Logistics, ICCL 2021
CityVirtual, Online
Period27/09/2129/09/21

Keywords

  • Lot-sizing
  • Mixed-integer linear programming
  • Production planning
  • Remanufacturing
  • Valid inequalities

Fingerprint

Dive into the research topics of 'New Valid Inequalities for a Multi-echelon Multi-item Lot-Sizing Problem with Returns and Lost Sales'. Together they form a unique fingerprint.

Cite this