Nitriles adsorbed on Si(001) at 300 K studied Via synchrotron radiation core-electron spectroscopies

François Rochist, Fabrice Bournel, Stephane Carniato, Georges Dufour, Jean Jacques Gallet, Vita Ilakovac, Karine Le Guen, Sylvie Rangan, Stephan Kubsky, Fausto Sirotti

Research output: Contribution to journalArticlepeer-review

Abstract

This paper focuses on the use and value of XPS arid NEXAFS spectroscopies to unveil the nature of the chemical bond of various bifunctional nitrile molecules adsorbed on Si(001) 2×1 at 300 K. The adsorption modes are also discussed in the light of recent theoretical publications devoted to optimized geometries and reaction paths of these molecules on Si(001).

Original languageEnglish
Pages (from-to)85-94
Number of pages10
JournalInternational Journal of Nanoscience
Volume6
Issue number2
DOIs
Publication statusPublished - 1 Apr 2007
Externally publishedYes

Keywords

  • Molecule
  • NEXAFS
  • Nitrile
  • Silicon
  • Synchrotron radiation
  • XPS

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