Skip to main navigation Skip to search Skip to main content

Non destructive methodology for defect detection and localization in Bragg gratings

  • CNRS SAMOVAR UMR 5157
  • Centre de Nanosciences et de Nanotechnologies

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper describes a simple methodology implying the use of optical low-coherence reflectometry and its associated simulations to detect and spatially localize defects in Bragg grating based emission devices such as a phase-shifted DFB laser and a DBR laser with an involuntarily introduced defect in the grating.

Original languageEnglish
Title of host publication2005 International Conference on Indium Phosphide and Related Materials
Pages578-581
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes
Event2005 International Conference on Indium Phosphide and Related Materials - Glasgow, Scotland, United Kingdom
Duration: 8 May 200512 May 2005

Publication series

NameConference Proceedings - International Conference on Indium Phosphide and Related Materials
Volume2005
ISSN (Print)1092-8669

Conference

Conference2005 International Conference on Indium Phosphide and Related Materials
Country/TerritoryUnited Kingdom
CityGlasgow, Scotland
Period8/05/0512/05/05

Fingerprint

Dive into the research topics of 'Non destructive methodology for defect detection and localization in Bragg gratings'. Together they form a unique fingerprint.

Cite this