Non intrusive fault detection through electromagnetism analysis

Sébastien Thomas; Didier Regis; David Faura; Marc Gatti; Guillaume Duc; Jean Luc Danger

doi:10.1109/ETFA.2011.6059065

Non intrusive fault detection through electromagnetism analysis

Sébastien Thomas
, Didier Regis
, David Faura
, Marc Gatti
, Guillaume Duc
, Jean Luc Danger

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper we introduce a fully non intrusive test method which is based on the Differential Electro-Magnetic Analysis (EMA). Our objective is to demonstrate the capability of this new method to detect stuck-at-0 faults voluntary injected in a full-custom circuit. This detection is carried out by comparing a reference trace, called Reference Signature, with a differential trace representing the observed electromagnetic activity. The results show the efficiency of the proposed method. We will then introduce the possibility offered by EM measurement to be used to detect degradation of physical parameters on equipments where no intrusions are allowed.

Original language	English
Title of host publication	Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011
DOIs	https://doi.org/10.1109/ETFA.2011.6059065
Publication status	Published - 11 Nov 2011
Event	2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011 - Toulouse, France Duration: 5 Sept 2011 → 9 Sept 2011

Publication series

Name	IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

Conference

Conference	2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011
Country/Territory	France
City	Toulouse
Period	5/09/11 → 9/09/11

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10.1109/ETFA.2011.6059065

Cite this

Thomas, S., Regis, D., Faura, D., Gatti, M., Duc, G., & Danger, J. L. (2011). Non intrusive fault detection through electromagnetism analysis. In Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011 Article 6059065 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). https://doi.org/10.1109/ETFA.2011.6059065

@inproceedings{65c8d465bef046559b1276ad851f5430,

title = "Non intrusive fault detection through electromagnetism analysis",

abstract = "In this paper we introduce a fully non intrusive test method which is based on the Differential Electro-Magnetic Analysis (EMA). Our objective is to demonstrate the capability of this new method to detect stuck-at-0 faults voluntary injected in a full-custom circuit. This detection is carried out by comparing a reference trace, called Reference Signature, with a differential trace representing the observed electromagnetic activity. The results show the efficiency of the proposed method. We will then introduce the possibility offered by EM measurement to be used to detect degradation of physical parameters on equipments where no intrusions are allowed.",

author = "S{\'e}bastien Thomas and Didier Regis and David Faura and Marc Gatti and Guillaume Duc and Danger, \{Jean Luc\}",

year = "2011",

month = nov,

day = "11",

doi = "10.1109/ETFA.2011.6059065",

language = "English",

isbn = "9781457700187",

series = "IEEE International Conference on Emerging Technologies and Factory Automation, ETFA",

booktitle = "Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011",

note = "2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011 ; Conference date: 05-09-2011 Through 09-09-2011",

}

Thomas, S, Regis, D, Faura, D, Gatti, M, Duc, G & Danger, JL 2011, Non intrusive fault detection through electromagnetism analysis. in Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011., 6059065, IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011, Toulouse, France, 5/09/11. https://doi.org/10.1109/ETFA.2011.6059065

Non intrusive fault detection through electromagnetism analysis. / Thomas, Sébastien; Regis, Didier; Faura, David et al.
Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011. 2011. 6059065 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Non intrusive fault detection through electromagnetism analysis

AU - Thomas, Sébastien

AU - Regis, Didier

AU - Faura, David

AU - Gatti, Marc

AU - Duc, Guillaume

AU - Danger, Jean Luc

PY - 2011/11/11

Y1 - 2011/11/11

N2 - In this paper we introduce a fully non intrusive test method which is based on the Differential Electro-Magnetic Analysis (EMA). Our objective is to demonstrate the capability of this new method to detect stuck-at-0 faults voluntary injected in a full-custom circuit. This detection is carried out by comparing a reference trace, called Reference Signature, with a differential trace representing the observed electromagnetic activity. The results show the efficiency of the proposed method. We will then introduce the possibility offered by EM measurement to be used to detect degradation of physical parameters on equipments where no intrusions are allowed.

AB - In this paper we introduce a fully non intrusive test method which is based on the Differential Electro-Magnetic Analysis (EMA). Our objective is to demonstrate the capability of this new method to detect stuck-at-0 faults voluntary injected in a full-custom circuit. This detection is carried out by comparing a reference trace, called Reference Signature, with a differential trace representing the observed electromagnetic activity. The results show the efficiency of the proposed method. We will then introduce the possibility offered by EM measurement to be used to detect degradation of physical parameters on equipments where no intrusions are allowed.

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U2 - 10.1109/ETFA.2011.6059065

DO - 10.1109/ETFA.2011.6059065

M3 - Conference contribution

AN - SCOPUS:80655128668

SN - 9781457700187

T3 - IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

BT - Proceedings of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011

T2 - 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011

Y2 - 5 September 2011 through 9 September 2011

ER -

Non intrusive fault detection through electromagnetism analysis

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