Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

J. Chalupský; L. Juna; V. Hájková; J. Cihelka; L. Vyšín; J. Gautier; J. Hajdu; S. P. Hau-Riege; M. Jurek; J. Krzywinski; R. A. London; E. Papalazarou; J. B. Pelka; G. Rey; S. Sebban; R. Sobierajski; N. Stojanovic; K. Tiedtke; S. Toleikis; T. Tschentscher; C. Valentin; H. Wabnitz; P. Zeitoun

doi:10.1364/OE.17.000208

Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

J. Chalupský, L. Juna, V. Hájková, J. Cihelka, L. Vyšín, J. Gautier, J. Hajdu, S. P. Hau-Riege, M. Jurek, J. Krzywinski, R. A. London, E. Papalazarou, J. B. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. TschentscherC. Valentin, H. Wabnitz, P. Zeitoun

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Abstract

We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.

Original language	English
Pages (from-to)	208-217
Number of pages	10
Journal	Optics Express
Volume	17
Issue number	1
DOIs	https://doi.org/10.1364/OE.17.000208
Publication status	Published - 5 Jan 2009

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Chalupský, J., Juna, L., Hájková, V., Cihelka, J., Vyšín, L., Gautier, J., Hajdu, J., Hau-Riege, S. P., Jurek, M., Krzywinski, J., London, R. A., Papalazarou, E., Pelka, J. B., Rey, G., Sebban, S., Sobierajski, R., Stojanovic, N., Tiedtke, K., Toleikis, S., ... Zeitoun, P. (2009). Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses. Optics Express, 17(1), 208-217. https://doi.org/10.1364/OE.17.000208

@article{044be6991a434ee98d151d554e709d8a,

title = "Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses",

abstract = "We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.",

author = "J. Chalupsk{\'y} and L. Juna and V. H{\'a}jkov{\'a} and J. Cihelka and L. Vy{\v s}{\'i}n and J. Gautier and J. Hajdu and Hau-Riege, \{S. P.\} and M. Jurek and J. Krzywinski and London, \{R. A.\} and E. Papalazarou and Pelka, \{J. B.\} and G. Rey and S. Sebban and R. Sobierajski and N. Stojanovic and K. Tiedtke and S. Toleikis and T. Tschentscher and C. Valentin and H. Wabnitz and P. Zeitoun",

year = "2009",

month = jan,

day = "5",

doi = "10.1364/OE.17.000208",

language = "English",

volume = "17",

pages = "208--217",

journal = "Optics Express",

issn = "1094-4087",

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Chalupský, J, Juna, L, Hájková, V, Cihelka, J, Vyšín, L, Gautier, J, Hajdu, J, Hau-Riege, SP, Jurek, M, Krzywinski, J, London, RA, Papalazarou, E, Pelka, JB, Rey, G, Sebban, S, Sobierajski, R, Stojanovic, N, Tiedtke, K, Toleikis, S, Tschentscher, T, Valentin, C, Wabnitz, H & Zeitoun, P 2009, 'Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses', Optics Express, vol. 17, no. 1, pp. 208-217. https://doi.org/10.1364/OE.17.000208

TY - JOUR

T1 - Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

AU - Chalupský, J.

AU - Juna, L.

AU - Hájková, V.

AU - Cihelka, J.

AU - Vyšín, L.

AU - Gautier, J.

AU - Hajdu, J.

AU - Hau-Riege, S. P.

AU - Jurek, M.

AU - Krzywinski, J.

AU - London, R. A.

AU - Papalazarou, E.

AU - Pelka, J. B.

AU - Rey, G.

AU - Sebban, S.

AU - Sobierajski, R.

AU - Stojanovic, N.

AU - Tiedtke, K.

AU - Toleikis, S.

AU - Tschentscher, T.

AU - Valentin, C.

AU - Wabnitz, H.

AU - Zeitoun, P.

PY - 2009/1/5

Y1 - 2009/1/5

N2 - We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.

AB - We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.

U2 - 10.1364/OE.17.000208

DO - 10.1364/OE.17.000208

M3 - Article

C2 - 19129890

AN - SCOPUS:58449101606

SN - 1094-4087

VL - 17

SP - 208

EP - 217

JO - Optics Express

JF - Optics Express

IS - 1

ER -

Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

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