Normal and anti Meyer-Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films

Sanjay K. Ram; Satyendra Kumar; P. Roca i Cabarrocas

doi:10.1016/j.jnoncrysol.2007.10.051

Normal and anti Meyer-Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films

Sanjay K. Ram, Satyendra Kumar, P. Roca i Cabarrocas

Indian Institute of Technology Kanpur

Research output: Contribution to journal › Article › peer-review

Abstract

We have studied the electrical conductivity behavior of highly crystallized undoped hydrogenated microcrystalline silicon (μc-Si:H) films having different microstructures. The dark conductivity is seen to follow Meyer-Neldel rule (MNR) in some films and anti-MNR in others, which has been explained on the basis of variation in the film microstructure and the corresponding changes in the effective density of states distributions. A band tail transport and statistical shift of Fermi level are used to explain the origin of MNR as well as anti-MNR in our samples. The observation of MNR and anti-MNR in electrical transport behavior of μc-Si:H is discussed in terms of the basic underlying physics of their origin and the significance of these relationships.

Original language	English
Pages (from-to)	2263-2267
Number of pages	5
Journal	Journal of Non-Crystalline Solids
Volume	354
Issue number	19-25
DOIs	https://doi.org/10.1016/j.jnoncrysol.2007.10.051
Publication status	Published - 1 May 2008

Keywords

Amorphous semiconductors
Chemical vapor deposition
Conductivity
Electrical and electronic properties
Ellipsometry
Films and coatings
Microcrystallinity
Microstructure
Photoconductivity
Plasma deposition
Solar cells
Surfaces and interfaces
Thin film transistors

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10.1016/j.jnoncrysol.2007.10.051

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title = "Normal and anti Meyer-Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films",

abstract = "We have studied the electrical conductivity behavior of highly crystallized undoped hydrogenated microcrystalline silicon (μc-Si:H) films having different microstructures. The dark conductivity is seen to follow Meyer-Neldel rule (MNR) in some films and anti-MNR in others, which has been explained on the basis of variation in the film microstructure and the corresponding changes in the effective density of states distributions. A band tail transport and statistical shift of Fermi level are used to explain the origin of MNR as well as anti-MNR in our samples. The observation of MNR and anti-MNR in electrical transport behavior of μc-Si:H is discussed in terms of the basic underlying physics of their origin and the significance of these relationships.",

keywords = "Amorphous semiconductors, Chemical vapor deposition, Conductivity, Electrical and electronic properties, Ellipsometry, Films and coatings, Microcrystallinity, Microstructure, Photoconductivity, Plasma deposition, Solar cells, Surfaces and interfaces, Thin film transistors",

author = "Ram, \{Sanjay K.\} and Satyendra Kumar and \{Roca i Cabarrocas\}, P.",

year = "2008",

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doi = "10.1016/j.jnoncrysol.2007.10.051",

language = "English",

volume = "354",

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journal = "Journal of Non-Crystalline Solids",

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T1 - Normal and anti Meyer-Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films

AU - Ram, Sanjay K.

AU - Kumar, Satyendra

AU - Roca i Cabarrocas, P.

PY - 2008/5/1

Y1 - 2008/5/1

N2 - We have studied the electrical conductivity behavior of highly crystallized undoped hydrogenated microcrystalline silicon (μc-Si:H) films having different microstructures. The dark conductivity is seen to follow Meyer-Neldel rule (MNR) in some films and anti-MNR in others, which has been explained on the basis of variation in the film microstructure and the corresponding changes in the effective density of states distributions. A band tail transport and statistical shift of Fermi level are used to explain the origin of MNR as well as anti-MNR in our samples. The observation of MNR and anti-MNR in electrical transport behavior of μc-Si:H is discussed in terms of the basic underlying physics of their origin and the significance of these relationships.

AB - We have studied the electrical conductivity behavior of highly crystallized undoped hydrogenated microcrystalline silicon (μc-Si:H) films having different microstructures. The dark conductivity is seen to follow Meyer-Neldel rule (MNR) in some films and anti-MNR in others, which has been explained on the basis of variation in the film microstructure and the corresponding changes in the effective density of states distributions. A band tail transport and statistical shift of Fermi level are used to explain the origin of MNR as well as anti-MNR in our samples. The observation of MNR and anti-MNR in electrical transport behavior of μc-Si:H is discussed in terms of the basic underlying physics of their origin and the significance of these relationships.

KW - Amorphous semiconductors

KW - Chemical vapor deposition

KW - Conductivity

KW - Electrical and electronic properties

KW - Ellipsometry

KW - Films and coatings

KW - Microcrystallinity

KW - Microstructure

KW - Photoconductivity

KW - Plasma deposition

KW - Solar cells

KW - Surfaces and interfaces

KW - Thin film transistors

U2 - 10.1016/j.jnoncrysol.2007.10.051

DO - 10.1016/j.jnoncrysol.2007.10.051

M3 - Article

AN - SCOPUS:42649136553

SN - 0022-3093

VL - 354

SP - 2263

EP - 2267

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

IS - 19-25

ER -

Normal and anti Meyer-Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films

Abstract

Keywords

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