On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica

Vinod Parmar; Nadège Ollier; Yves Bellouard

On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica

Vinod Parmar, Nadège Ollier, Yves Bellouard

Research output: Contribution to conference › Paper › peer-review

Abstract

The non-ablative interaction of femtosecond laser pulses with fused silica leads to defects creation in the silica glass network. Here, we report on the correlation between defects and localized accelerated etching, that enables three-dimensional manufacturing process.

Original language	English
Publication status	Published - 1 Jan 2024
Externally published	Yes
Event	CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics - Charlotte, United States Duration: 5 May 2024 → 10 May 2024

Conference

Conference	CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics
Country/Territory	United States
City	Charlotte
Period	5/05/24 → 10/05/24

Cite this

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title = "On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica",

abstract = "The non-ablative interaction of femtosecond laser pulses with fused silica leads to defects creation in the silica glass network. Here, we report on the correlation between defects and localized accelerated etching, that enables three-dimensional manufacturing process.",

author = "Vinod Parmar and Nad{\`e}ge Ollier and Yves Bellouard",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2024, {\textcopyright} 2024 The Author(s); CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics ; Conference date: 05-05-2024 Through 10-05-2024",

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day = "1",

language = "English",

}

On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica. / Parmar, Vinod; Ollier, Nadège; Bellouard, Yves.
2024. Paper presented at CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics, Charlotte, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica

AU - Parmar, Vinod

AU - Ollier, Nadège

AU - Bellouard, Yves

PY - 2024/1/1

Y1 - 2024/1/1

N2 - The non-ablative interaction of femtosecond laser pulses with fused silica leads to defects creation in the silica glass network. Here, we report on the correlation between defects and localized accelerated etching, that enables three-dimensional manufacturing process.

AB - The non-ablative interaction of femtosecond laser pulses with fused silica leads to defects creation in the silica glass network. Here, we report on the correlation between defects and localized accelerated etching, that enables three-dimensional manufacturing process.

M3 - Paper

AN - SCOPUS:85205024602

T2 - CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics

Y2 - 5 May 2024 through 10 May 2024

ER -

On the correlation between femtosecond laser-induced defects taxonomy and localized accelerated chemical etching in fused silica

Abstract

Conference

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