On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

Gerald Berghoff; Eric Bergeault; Bernard Huyart; Louis Jallet

doi:10.1109/19.676722

On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

Gerald Berghoff
, Eric Bergeault
, Bernard Huyart
, Louis Jallet

Telecom Paris

Research output: Contribution to journal › Article › peer-review

Abstract

The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.

Original language	English
Pages (from-to)	1111-1114
Number of pages	4
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	46
Issue number	5
DOIs	https://doi.org/10.1109/19.676722
Publication status	Published - 1 Dec 1997

Keywords

Absolute power measurements
De-embedding techniques
Double six-port
Load-pull
Nonlinear measurements
On-wafer calibration

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10.1109/19.676722

Cite this

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title = "On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements",

abstract = "The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.",

keywords = "Absolute power measurements, De-embedding techniques, Double six-port, Load-pull, Nonlinear measurements, On-wafer calibration",

author = "Gerald Berghoff and Eric Bergeault and Bernard Huyart and Louis Jallet",

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AU - Berghoff, Gerald

AU - Bergeault, Eric

AU - Huyart, Bernard

AU - Jallet, Louis

PY - 1997/12/1

Y1 - 1997/12/1

N2 - The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.

AB - The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.

KW - Absolute power measurements

KW - De-embedding techniques

KW - Double six-port

KW - Load-pull

KW - Nonlinear measurements

KW - On-wafer calibration

U2 - 10.1109/19.676722

DO - 10.1109/19.676722

M3 - Article

AN - SCOPUS:0031250186

SN - 0018-9456

VL - 46

SP - 1111

EP - 1114

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 5

ER -

On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

Abstract

Keywords

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