Open-circuit voltage increase dynamics in high and low deposition rate polymorphous silicon solar cells

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Abstract

The dynamics of the open-circuit voltage (V OC) of polymorphous silicon (pm-Si:H) solar cells deposited at high and low rates (8 and 1.5 Å/s, HR and LR) and containing lightly or heavily doped p-layers (LD or HD) are compared through in situ, variable intensity measurements during light-soaking (LS). The V OC's of the LR cells show an increase with LS, regardless of doping level, whereas the HR cells show decreasing V OC's. This result is in contrast to the changes predicted by the dark diode characteristics, which predict increasing V OC for all the devices. The device measurements are compared to the analogous measurements on co-deposited coplanar p-i layer stacks to determine whether the V OC dynamics can be linked to changes in the p-layer doping efficiency during LS. The changes to the macroscopic electrical behaviour of the cell under varying light conditions are modelled using a simple, three parameter function, and are compared to results from a detailed, numerical modelling tool, AFORS-HET.

Original languageEnglish
Pages (from-to)691-694
Number of pages4
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume207
Issue number3
DOIs
Publication statusPublished - 1 Mar 2010

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