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Optical gap and optically active intragap defects in cubic BN

  • Anna Tararan
  • , Stefano Di Sabatino
  • , Matteo Gatti
  • , Takashi Taniguchi
  • , Kenji Watanabe
  • , Lucia Reining
  • , Luiz H.G. Tizei
  • , Mathieu Kociak
  • , Alberto Zobelli
  • Laboratoire de Physique des Solides
  • Université Paris-Saclay
  • European Theoretical Spectroscopy Facility (ETSF
  • Synchrotron SOLEIL
  • National Institute for Materials Science

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

We report a comprehensive study on the optical properties of cubic boron nitride (c-BN) and its optically active defects. Using electron energy-loss spectroscopy (EELS) within a monochromated scanning transmission electron microscope (STEM) on the highest-quality crystals available, we demonstrate unequivocally that the optical-gap energy of c-BN slightly exceeds 10 eV. Further theoretical analysis in the framework of the Bethe-Salpeter equation of many-body perturbation theory supports this result. The spatial localization of defect-related emissions has been investigated using nanometric resolved cathodoluminescence (nano-CL) in a STEM. By high-temperature annealing a c-BN powder, we have promoted phase transitions in nanometric domains which have been detected by the appearance of specific hexagonal-phase signatures in both EELS and CL spectra. A high number of intragap optically active centers are known in c-BN, but the literature is rather scattered and hence has been summarized here. For several emission lines we have obtained nano-CL maps which show emission spot sizes as small as few tens of nanometers. Finally, by coupling nano-CL to a Hanbury-Brown-Twiss intensity interferometer, we have addressed individual spots in order to identify the possible presence of single-photon sources. The observed CL bunching effect is compatible with a limited set of single-photon emitters and it permits obtaining emission lifetimes of the order of the nanosecond.

Original languageEnglish
Article number094106
JournalPhysical Review B
Volume98
Issue number9
DOIs
Publication statusPublished - 17 Sept 2018
Externally publishedYes

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