Origin of linear extended defects in single crystalline Bi 2Sr2CaCu2O8

Ming Li; P. H. Kes; S. F.W.R. Rycroft; C. J. Van Der Beek; M. Konczykowski

doi:10.1016/j.physc.2004.02.021

Origin of linear extended defects in single crystalline Bi ₂Sr₂CaCu₂O₈

Ming Li
, P. H. Kes
, S. F.W.R. Rycroft
, C. J. Van Der Beek
, M. Konczykowski

École Polytechnique

Research output: Contribution to journal › Conference article › peer-review

Abstract

Magneto-optical imaging and direction-dependent resistivity measurements are cross-correlated to provide evidence that the extended line defects in Bi₂Sr₂CaCu₂O₈ single crystals are needle-like Bi₂Sr₂Ca₂Cu₃O ₁₀ intergrowths that form along the crystal growth direction.

Original language	English
Pages (from-to)	25-26
Number of pages	2
Journal	Physica C: Superconductivity and its Applications
Volume	408-410
Issue number	1-4
DOIs	https://doi.org/10.1016/j.physc.2004.02.021
Publication status	Published - 1 Aug 2004
Event	Proceedings of the International Conference on Materials - Rio de Janeiro, Brazil Duration: 25 May 2003 → 30 May 2003

Keywords

Bi-2212
Crystal growth
Flux pinning
Linear defects

Access to Document

10.1016/j.physc.2004.02.021

Cite this

@article{dcda80d21416438c9c990f0a4e482e45,

title = "Origin of linear extended defects in single crystalline Bi 2Sr2CaCu2O8",

abstract = "Magneto-optical imaging and direction-dependent resistivity measurements are cross-correlated to provide evidence that the extended line defects in Bi2Sr2CaCu2O8 single crystals are needle-like Bi2Sr2Ca2Cu3O 10 intergrowths that form along the crystal growth direction.",

keywords = "Bi-2212, Crystal growth, Flux pinning, Linear defects",

author = "Ming Li and Kes, \{P. H.\} and Rycroft, \{S. F.W.R.\} and \{Van Der Beek\}, \{C. J.\} and M. Konczykowski",

year = "2004",

month = aug,

day = "1",

doi = "10.1016/j.physc.2004.02.021",

language = "English",

volume = "408-410",

pages = "25--26",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

number = "1-4",

note = "Proceedings of the International Conference on Materials ; Conference date: 25-05-2003 Through 30-05-2003",

}

TY - JOUR

T1 - Origin of linear extended defects in single crystalline Bi 2Sr2CaCu2O8

AU - Li, Ming

AU - Kes, P. H.

AU - Rycroft, S. F.W.R.

AU - Van Der Beek, C. J.

AU - Konczykowski, M.

PY - 2004/8/1

Y1 - 2004/8/1

N2 - Magneto-optical imaging and direction-dependent resistivity measurements are cross-correlated to provide evidence that the extended line defects in Bi2Sr2CaCu2O8 single crystals are needle-like Bi2Sr2Ca2Cu3O 10 intergrowths that form along the crystal growth direction.

AB - Magneto-optical imaging and direction-dependent resistivity measurements are cross-correlated to provide evidence that the extended line defects in Bi2Sr2CaCu2O8 single crystals are needle-like Bi2Sr2Ca2Cu3O 10 intergrowths that form along the crystal growth direction.

KW - Bi-2212

KW - Crystal growth

KW - Flux pinning

KW - Linear defects

U2 - 10.1016/j.physc.2004.02.021

DO - 10.1016/j.physc.2004.02.021

M3 - Conference article

AN - SCOPUS:4344643314

SN - 0921-4534

VL - 408-410

SP - 25

EP - 26

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

IS - 1-4

T2 - Proceedings of the International Conference on Materials

Y2 - 25 May 2003 through 30 May 2003