OXIDATION OF SILICON SURFACES.

  • A. Redondo
  • , W. A. Goddard
  • , C. A. Swarts
  • , T. C. McGill

Research output: Contribution to journalConference articlepeer-review

Abstract

The authors have carried out theoretical studies (generalized valence bond) for chemisorbed O atom and O//2 molecule on Si(111) surfaces using clusters of atoms to model the surface. For the perfect surface the authors find that O//2 molecule binds to a single surface Si with an Si-O bond length of 1. 68 Angstrom (bulk SiO//2R//S//i//- //O equals 1. 61 A), an Si-O-O angle of 116 degree , and an O-O bond distance of 1. 32 Angtrom. The authors have also calculated the shifts in the Si(2p) and O(1s) core level energies for chemisorbed O and O//2 on the surface. The Si(2p) shift is plus 1. 1 ev (higher binding energy) for the O atom and plus 1. 5 ev for O//2, in agreement with the shifts observed for low oxygen exposure by W. E. Spicer and co-workers.

Original languageEnglish
Pages (from-to)498-501
Number of pages4
JournalJ Vac Sci Technol
Volume19
Issue number3
DOIs
Publication statusPublished - 1 Jan 1981
Externally publishedYes
EventProc of the Annu Conf on the Phys of Compd Semicond Interfaces, 8th - Williamsburg, VA, USA
Duration: 27 Jan 198129 Jan 1981

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