@inproceedings{1c2c2cca089a4854a8e025d746dc53bb,
title = "OxRAM-based non volatile flip-flop in 28nm FDSOI",
abstract = "This paper presents a robust OxRAM-based nonvolatile flip-flop (NVFF) solution, designed for deep nano-scaled CMOS technologies. Forming, set and reset operations rely on a reliable design approach using thin gate oxide CMOS. The NVFF is benchmarked against a standard FF in 28nm CMOS FDSOI. Non-volatility is added with minimal impact on the FF performances.",
author = "N. Jovanovi{\'c} and O. Thomas and E. Vianello and Portal, \{J. M.\} and B. Nikoli{\'c} and L. Naviner",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 12th IEEE International New Circuits and Systems Conference, NEWCAS 2014 ; Conference date: 22-06-2014 Through 25-06-2014",
year = "2014",
month = oct,
day = "22",
doi = "10.1109/NEWCAS.2014.6934003",
language = "English",
series = "2014 IEEE 12th International New Circuits and Systems Conference, NEWCAS 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "141--144",
booktitle = "2014 IEEE 12th International New Circuits and Systems Conference, NEWCAS 2014",
}