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Phase-sensitive characterization of short scale-length plasmas

  • J. P. Geindre
  • , P. Audebert
  • , F. Fallies
  • , A. Rousse
  • , J. C. Gauthier
  • , A. Antonetti
  • , J. P. Chambaret
  • , G. Grillon
  • , A. Mysyrowicz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents the different methods of characterizing the phase-sensitivity of short scale length plasmas. From time-resolved measurements of the absolute reflectivity of a short probe pulse as a function of angle and polarization one can extract information on the plasma density gradient. A more direct method relies on the spectral analysis of the reflected probe beam at different delays. Another method is described with an improved sensitivity. These methods are tested in two different plasma regimes.

Original languageEnglish
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
PublisherPubl by IEEE
Pages433-434
Number of pages2
ISBN (Print)0780319710
Publication statusPublished - 1 Jan 1994
EventProceedings of the Conference on Lasers and Electro-Optics - Anaheim, CA, USA
Duration: 8 May 1994 → 13 May 1994

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
Volume8

Conference

ConferenceProceedings of the Conference on Lasers and Electro-Optics
CityAnaheim, CA, USA
Period8/05/94 → 13/05/94

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