Photoexcited electron dynamics and energy loss rate in silicon: temperature dependence and main scattering channels

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we revisit the DFT-based results for the electron-phonon scattering in highly excited silicon. Using state-of-the-art ab initio methods, we examine the main scattering channels which contribute to the total electron-phonon scattering rate and to the energy loss rate of photoexcited electrons in silicon as well as their temperature dependence. Both temperature dependence and the main scattering channels are shown to strongly differ for the total electron-phonon scattering rate and for the energy loss rate of photoexcited electrons. Whereas the total electron-phonon scattering rate increases strongly with temperature, the temperature dependence of the energy loss rate is negligible. Also, while acoustic phonons dominate the total electron-phonon scattering rate at 300 K, the main contribution to the energy loss rate comes from optical modes.

Original languageEnglish
Title of host publicationAdvances in Ultrafast Condensed Phase Physics III
EditorsStefan Haacke, Vladislav Yakovlev
PublisherSPIE
ISBN (Electronic)9781510651401
DOIs
Publication statusPublished - 1 Jan 2022
EventAdvances in Ultrafast Condensed Phase Physics III 2022 - Virtual, Online
Duration: 9 May 202220 May 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12132
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvances in Ultrafast Condensed Phase Physics III 2022
CityVirtual, Online
Period9/05/2220/05/22

Keywords

  • electron-phonon coupling
  • photoexcited electrons
  • semiconductor
  • silicon

Fingerprint

Dive into the research topics of 'Photoexcited electron dynamics and energy loss rate in silicon: temperature dependence and main scattering channels'. Together they form a unique fingerprint.

Cite this