@inproceedings{6bcfebb5aa2a442fa4bb30d6075199e6,
title = "Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam",
abstract = "We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.",
keywords = "Hard X-ray FEL, LiF imaging detectors, Photoluminescent color centers, Pump-probe experiment, X-ray radiography",
author = "F. Bonfigli and Hartley, \{N. J.\} and Y. Inubushi and M. Koenig and T. Matsuoka and S. Makarov and Montereali, \{R. M.\} and E. Nichelatti and N. Ozaki and M. Piccinini and S. Pikuz and T. Pikuz and D. Sagae and Vincenti, \{M. A.\} and M. Yabashi and T. Yabuuchi",
note = "Publisher Copyright: {\textcopyright} 2019 SPIE.; Optics Damage and Materials Processing by EUV/X-ray Radiation VII 2019 ; Conference date: 01-04-2019 Through 03-04-2019",
year = "2019",
month = jan,
day = "1",
doi = "10.1117/12.2520907",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Libor Juha and Sasa Bajt and Stephane Guizard",
booktitle = "Optics Damage and Materials Processing by EUV/X-ray Radiation VII",
}