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Photonic band measurement by angle-resolved spectroscopy and polarimetry

  • Zdenek Král
  • , Josep Ferré-Borrull
  • , Lluis F. Marsal
  • , Josep Pallarès
  • , Enric Garcia-Caurel
  • , Martin Foldyna
  • , Santiago M. Olaizola
  • Universitat Rovira i Virgili
  • Institut polytechnique de Paris
  • Clínica Universidad de Navarra

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work we show the application of the angle-resolved spectroscopic reflectivity and polarimetry to the characterization of 2D photonic crystal structures in the form of slabs. The method we introduce is based on the combination of i) the numerical simulation of the interaction of the incident light with the photonic crystal, ii) the experimental measurement and iii) the comparison of both results. We show that the calculations predict the coupling of the incident light to photonic modes propagating inside the structure, related to the photonic bands of the infinite photonic crystal. We demonstrate this coupling in the experimental measurements for two kinds of samples consisting of 2D photonic crystal slabs of micro- and nanostructured photoresist on a silicon substrate.

Original languageEnglish
Title of host publicationProceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
Pages394-397
Number of pages4
DOIs
Publication statusPublished - 24 Apr 2009
Event2009 Spanish Conference on Electron Devices, CDE'09 - Santiago de Compostela, Spain
Duration: 11 Feb 200913 Feb 2009

Publication series

NameProceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

Conference

Conference2009 Spanish Conference on Electron Devices, CDE'09
Country/TerritorySpain
CitySantiago de Compostela
Period11/02/0913/02/09

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