Abstract
The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 1016 W cm-2 at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5-8 eV with electron density in the range 1021-1022 cm-3. These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication.
| Original language | English |
|---|---|
| Pages (from-to) | 109-112 |
| Number of pages | 4 |
| Journal | High Energy Density Physics |
| Volume | 6 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2010 |
Keywords
- VUV-FEL
- Warm dense plasma
- XUV spectroscopy
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