Polarization influence on the sensitivity to side -wall roughness in ultra-small square SOI waveguides

F. Grillot, L. Vivien, S. Laval, D. Pascal, E. Cassan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Numerical investigations of scattering loss induced by side -wall ro ughness are performed for SOI square strip waveguides under quasi -TE and quasi -TM polarizati ons. Propagation loss is calculated for waveguide sizes ra nging from 500nm to 100nm. Simulations show when the incident fundamental mode polarization is a quasi -TM one, lower propagation loss is expected.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO-2004
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)1557527792
Publication statusPublished - 1 Jan 2004
Externally publishedYes
EventFrontiers in Optics, FiO-2004 - Rochester, United States
Duration: 12 Oct 2004 → …

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceFrontiers in Optics, FiO-2004
Country/TerritoryUnited States
CityRochester
Period12/10/04 → …

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