Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI

P. Finetti, E. Allaria, B. Diviacco, C. Callegari, B. Mahieu, J. Viefhaus, M. Zangrando, G. De Ninno, G. Lambert, E. Ferrari, J. Buck, M. Ilchen, B. Vodungbo, N. Mahne, C. Svetina, C. Spezzani, S. Di Mitri, G. Penco, M. Trovò, W. M. FawleyP. Rebernik, D. Gauthier, C. Grazioli, M. Coreno, B. Ressel, A. Kivimäki, T. Mazza, L. Glaser, F. Scholz, J. Seltmann, P. Gessler, J. Grünert, A. De Fanis, M. Meyer, A. Knie, S. P. Moeller, L. Raimondi, F. Capotondi, E. Pedersoli, O. Plekan, M. Danailov, A. Demidovich, I. Nikolov, A. Abrami, J. Gautier, J. Lüning, P. Zeitoun, L. Giannessia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

FERMI, based at Elettra (Trieste, Italy) is the first free electron laser (FEL) facility operated for user experiments in seeded mode. Another unique property of FERMI, among other FEL sources, is to allow control of the polarization state of the radiation. Polarization dependence in the study of the interaction of coherent, high field, short-pulse ionizing radiation with matter, is a new frontier with potential in a wide range of research areas. The first measurement of the polarization-state of VUV light from a single-pass FEL was performed at FERMI FEL-1 operated in the 52 nm-26 nm range. Three different experimental techniques were used. The experiments were carried out at the end-station of two different beamlines to assess the impact of transport optics and provide polarization data for the end user. In this paper we summarize the results obtained from different setups. The results are consistent with each other and allow a general discussion about the viability of permanent diagnostics aimed at monitoring the polarization of FEL pulses.

Original languageEnglish
Title of host publicationX-Ray Free-Electron Lasers
Subtitle of host publicationBeam Diagnostics, Beamline Instrumentation, and Applications II
EditorsStefan P. Moeller, Makina Yabashi, Stefan P. Hau-Riege
PublisherSPIE
ISBN (Electronic)9781628412376
DOIs
Publication statusPublished - 1 Jan 2014
EventX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - San Diego, United States
Duration: 18 Aug 201419 Aug 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9210
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Country/TerritoryUnited States
CitySan Diego
Period18/08/1419/08/14

Keywords

  • FEL
  • Polarimetry
  • Polarization
  • VUV

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