Abstract
We used scanning tunneling microscopy-tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.
| Original language | English |
|---|---|
| Pages (from-to) | 1301-1305 |
| Number of pages | 5 |
| Journal | Applied Spectroscopy |
| Volume | 61 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 1 Dec 2007 |
| Externally published | Yes |
Keywords
- Brilliant cresyl blue
- Polarization
- STM
- Scanning tunneling microscopy
- Si
- TERS
- Tip-enhanced Raman spectroscopy
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