Abstract
We propose a novel method for completely characterizing ultrashort pulses at extreme-ultraviolet (XUV) wavelengths by adapting the technique of spectral phase interferometry for direct electric-field reconstruction to this spectral region. Two-electron wave packets are coherently produced by photoionizing atoms with two time-delayed replicas of the XUV pulse. For one of the XUV pulses, photoionization occurs in the presence of a strong infrared pulse that ponderomotively shifts the binding energy, thereby providing the spectral shear needed for reconstruction of the spectral phase of the XUV pulse.
| Original language | English |
|---|---|
| Pages (from-to) | 2393-2395 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 28 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 1 Dec 2003 |
| Externally published | Yes |
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