Positron annihilation and charge state of the vacancies in as-grown and electron irradiated GaAs

Research output: Contribution to journalArticlepeer-review

Abstract

We use positron lifetime studies performed in GaAs materials to show the defect properties which can be investigated by implanting positive positrons in semiconductors. The studies concern native and electron irradiation induced defects. These studies show that vacancy charge state and vacancy ionization levels can be determined from positron annihilation. They show also that positrons are trapped by negative ions and give information on their concentration.

Original languageEnglish
Pages (from-to)166-172
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume63
Issue number1-2
DOIs
Publication statusPublished - 1 Jan 1992
Externally publishedYes

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