Abstract
We discuss the implications of a frequency-dependent complex dielectric function ε(ω) of a metal for the interpretation of scanning near-field optical microscopy (SNOM) measurements in the vicinity of metallic nanoapertures. For subwavelength slits in gold films we observe distinct spatial intensity oscillations in the near-field signal for specific wavelengths in the visible spectrum. These oscillations of the SNOM signal far away from the nanoslit are ascribed to a constructive interference between the propagating surface plasmon (SP) with light scattered parallel to the gold-air interface. In these spatial SNOM-signal oscillations information about the surface plasmon dielectric function is encoded which can be extracted, for example, in surface plasmon interferometry for applications as sensors or waveguides.
| Original language | English |
|---|---|
| Pages (from-to) | 171-176 |
| Number of pages | 6 |
| Journal | Applied Physics B: Lasers and Optics |
| Volume | 93 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Oct 2008 |
| Externally published | Yes |
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