Property analysis and design understanding in a quality-driven bounded model checking flow

Ulrich Kühne, Daniel Große, Rolf Drechsler

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the design process of digital systems, functional verification is a major issue. Generally, formal methods like bounded model checking (BMC) offer the highest quality of the verification results, especially when used in combination with techniques that check if a set of properties forms a complete specification of a design. However, in contrast to simulationbased methods, like random testing, formal verification requires a detailed knowledge of the design implementation. Formalizing a specification as a set of properties is a tedious and time consuming process. In this paper, we show the application of techniques to aid the verification engineer in writing properties in a qualitydriven BMC flow, that have been introduced in [1]. The first method can be used to remove redundant assumptions from properties and to separate different scenarios. The second technique, here called inverse property checking, takes an expected behavior of a design and automatically generates valid properties that can be checked for conformance with a specification. Both techniques can serve to reduce the number of iterations to obtain full coverage, when integrated with the verification flow. The benefits of the techniques are demonstrated with a memory management unit.

Original languageEnglish
Title of host publication9th International Workshop on Microprocessor Test and Verification
Subtitle of host publicationCommon Challenges and Solutions, MTV 2008
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages88-93
Number of pages6
ISBN (Print)9780769535814
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes
Event2009 9th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2008 - Austin, TX, United States
Duration: 8 Dec 200810 Dec 2008

Publication series

NameProceedings - International Workshop on Microprocessor Test and Verification
ISSN (Print)1550-4093

Conference

Conference2009 9th International Workshop on Microprocessor Test and Verification: Common Challenges and Solutions, MTV 2008
Country/TerritoryUnited States
CityAustin, TX
Period8/12/0810/12/08

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