Ptychographic characterization of an intense high-harmonic-seeded femtosecond soft X-ray laser

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report the direct wavefront characterization of an intense ultrafast high-harmonic-seeded soft X-ray laser (=32.8 nm) and monitor the laser plasma amplifier depending on the arrival time of the seed pulses by high-resolution ptychographic imaging.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2019
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580576
DOIs
Publication statusPublished - 1 Jan 2019
EventCLEO: Science and Innovations, CLEO_SI 2019 - San Jose, United States
Duration: 5 May 201910 May 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F129-CLEO_SI 2019
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Science and Innovations, CLEO_SI 2019
Country/TerritoryUnited States
CitySan Jose
Period5/05/1910/05/19

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