Radiation damage to amorphous-carbon optical coatings

  • L. Juha
  • , M. Bittner
  • , M. De Grazia
  • , J. Feldhaus
  • , J. Gaudin
  • , S. Guizard
  • , S. Jacobi
  • , M. Kozlová
  • , J. Krása
  • , J. Krzywinski
  • , H. Merdji
  • , C. Michaelsen
  • , T. Mocek
  • , R. Nietubyc
  • , M. Jurek
  • , J. Polan
  • , A. R. Präg
  • , B. Rus
  • , R. Sobierajski
  • , B. Steeg-Keitel
  • M. Störmer, M. Stupka, V. Vorlíček, J. Wiesmann, J. Wild

Research output: Contribution to journalConference articlepeer-review

Abstract

The multi-mJ, 21-nm soft-x-ray laser at the PALS facility was focused onto the surfaces of amorphous carbon (a-C) coatings, developed for heavily loaded XUV/x-ray optical elements. AFM (Atomic Force Microscopy) images show a 3-micrometer expansion of the irradiated material. Raman spectra, measured with an Ar+ laser microbeam in both irradiated and unirradiated areas, confirm a high degree of graphitization in the irradiated layer. In addition to this highfluence (∼ 1 J/cm2), single-shot experiment, it was necessary to carry out an experiment to investigate the consequences of prolonged XUV irradiation at relatively low fluence. A high-order harmonic (HH) beam generated at the LUCA facility of the CEA/Saclay Research Center was used as a source of short-wavelength radiation delivering high-energy photons to the surfaces at a low single-shot fluence but with high-average power. a-C irradiated at low fluence, (< 0.1 mJ/cm2) by many HH shots exhibits an expansion of several nanometers. Although it is a less dramatic change of surface morphology than that due to single-shot x-ray-laser exposures, even the observed nanometer-sized changes caused on an a-C surface by an HH beam could influence the reflectivity of a grazing incidence optical element. These results seem to be important for estimating damage to surfaces of highly irradiated optical elements developed for guiding and focusing the ultra-intense XUV/x-ray beams provided by the new generation of sources (VUV FEL and XFEL in Hamburg; LCLS in Stanford) because, up to now, only melting and vaporization, and not graphitization, have been taken into account.

Original languageEnglish
Article number59170F
Pages (from-to)1-6
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5917
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes
EventFourth Generation X-Ray Sources and Optics III - San Diego, CA, United States
Duration: 3 Aug 20054 Aug 2005

Keywords

  • Amorphous carbon
  • Atomic force microscopy
  • Free-electron laser
  • High-order harmonics
  • Radiation damage
  • Short-wavelength laser
  • Soft x-rays
  • XUV radiation

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