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Radiation effects in a SPACIROC2 ASIC and long-term reliability

  • V. M. Placinta
  • , L. N. Cojocariu
  • , C. De La Taille
  • , S. Blin-Bondil
  • , S. Mattiazzo
  • , L. Silvestrin
  • , A. Candelori
  • , F. MacIuc
  • Horia Hulubei National Institute for RandD in Physics and Nuclear Engineering (IFIN-HH)
  • Omega (Centre de Microélectronique)-École Polytechnique
  • Department of Engineering and Applied Science
  • Dipartimento di Fisica
  • INFN
  • Department of Physics and Astronomy
  • University of Padova

Research output: Contribution to journal › Article › peer-review

Abstract

The study presented in this paper outlines the measurements done to evaluate the performance of the second version of the SPACIROC ASIC in ionizing radiation environments using different types of particle beams: ions, protons and X-rays. From ion beam tests, the threshold linear energy transfer (LET) for SEU production was restricted between (4.4 ± 0.4) MeV•cm2/mg and (8.6 ± 0.8) MeV•cm2/mg. The corresponding cross-section value for the latter is (1.6-1.4+4.18)• 10-6 cm2/device - with asymmetric errors corresponding to 95% confidence level (CL) - and (0.5-0.34+0.6)• 10-5 cm2/device (CL 95%) for a LET of 11.2 ± 1.1 MeV•cm2/mg. A cross-section for high energy hadrons (HEH) above 20 MeV till about 1 GeV was measured and we place the actual value in 0.32 • 10-12 cm2/device-6 • 10-12 cm2/device interval with a high CL of about 95%. A room-temperature annealing process was observed and precisely measured over time, which efficiently mitigates within few days all residual TID effects that were induced at a very high dose rate of order of 100s rad/s. The obtained results are extrapolated to a few accelerator and space-based applications and we predict no major operational impediments within the lifetime of these experiments.

Original languageEnglish
Article numberP07028
JournalJournal of Instrumentation
Volume16
Issue number7
DOIs
Publication statusPublished - 1 Jul 2021
Externally publishedYes

Keywords

  • Front-end electronics for detector readout
  • digital electronic circuits
  • radiation-hard electronics
  • vLSI circuits

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