Abstract
The aim of this article was to report the effects of γ-radiation on type-I Infrasil silica glass with different fictive temperatures, Tf, for harsh environment applications. Radiation-induced attenuation in the visible range is found to be much lower in low fictive temperature samples. Photoluminescence experiments show that glasses with higher fictive temperatures have a higher nonbridging oxygen hole centers defect concentration generated by irradiation. In addition, electron paramagnetic resonance studies reveal higher E’ point defects, AlOHC, and hydrogen(II) defects in high Tf samples. In general, we find that the γ-radiation “hardness” of Infrasil301 silica glass becomes significantly higher with decreasing fictive temperature.
| Original language | English |
|---|---|
| Pages (from-to) | 285-290 |
| Number of pages | 6 |
| Journal | International Journal of Applied Glass Science |
| Volume | 8 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Sept 2017 |
| Externally published | Yes |
Keywords
- defects
- fiber materials
- fictive temperature
- radiation resistance
- silica