Abstract
Optically-transparent LiF film radiation imaging detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5×103 Gy, were investigated by fluorescence microscopy to evaluate their visible photoluminescence response of X-ray induced colour centres and their spatial resolution. By edge-enhancement imaging experiments, performed by irradiating LiF film detectors with an Au mesh in front of them, a spatial resolution of ∼0.3 μm was estimated. This high spatial resolution, combined with the large field of view and the wide dynamic range offered by LiF detectors, encourages their use in X-ray imaging and for high-energy density experiments in synchrotron facilities.
| Original language | English |
|---|---|
| Article number | C07001 |
| Journal | Journal of Instrumentation |
| Volume | 20 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Jul 2025 |
| Externally published | Yes |
Keywords
- Materials for solid-state detectors
- Solid state detectors
- X-ray detectors
- X-ray diffraction detectors