Random dynamic interferometer: Cavity amplified speckle spectroscopy using a highly symmetric coherent field created inside a closed Lambertian optical cavity

Guillaume Graciani, Francois Amblard

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A new kind of interferometry is presented, based on the maximal disorder of a single-frequency laser light coherently resonating inside a closed cavity with diffuse reflective walls. After thousands of Lambertian reflections, the optical field at any point inside the cavity is the coherent superposition of a huge number of modes that individually and independently obey a single probability distribution, which is invariant by rotations and translations regardless of the cavity geometry. The resulting interference speckle field has the same statistical properties and exhibits extreme sensitivity to phase fluctuations. From speckle intensity fluctuations, we can measure the various causes that perturb light propagation, be it deformations of the cavity, dynamic scattering of the propagation medium, or fluctuations of the input light phase. Preliminary experiments indicate that strains down to 10-10 can be detected, that correspond to picometer cavity deformations. This concept of "scrambled" interferometer opens new possibilities in the field of accelerometry or vibrometry, as well as for the enhancement of dynamic or multiple light scattering techniques.

Original languageEnglish
Title of host publicationApplied Optical Metrology III
EditorsErik Novak, James D. Trolinger
PublisherSPIE
ISBN (Electronic)9781510628977
DOIs
Publication statusPublished - 1 Jan 2019
Externally publishedYes
EventApplied Optical Metrology III 2019 - San Diego, United States
Duration: 13 Aug 201915 Aug 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11102
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optical Metrology III 2019
Country/TerritoryUnited States
CitySan Diego
Period13/08/1915/08/19

Keywords

  • Amplification
  • DLS
  • DWS
  • Decorrelation spectroscopy
  • Disorder
  • Interferometer
  • Light scattering
  • Metrology
  • Optical cavity
  • Speckle

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