Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis

Samuel N. Pagliarini; Tian Ban; Lirida A. De Naviner; Jean Francois Naviner

doi:10.1109/MWSCAS.2013.6674598

Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis

Samuel N. Pagliarini, Tian Ban, Lirida A. De Naviner, Jean Francois Naviner

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63% smaller for the studied circuits.

Original language	English
Title of host publication	2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
Pages	113-116
Number of pages	4
DOIs	https://doi.org/10.1109/MWSCAS.2013.6674598
Publication status	Published - 1 Dec 2013
Externally published	Yes
Event	2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013 - Columbus, OH, United States Duration: 4 Aug 2013 → 7 Aug 2013

Publication series

Name	Midwest Symposium on Circuits and Systems
ISSN (Print)	1548-3746

Conference

Conference	2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
Country/Territory	United States
City	Columbus, OH
Period	4/08/13 → 7/08/13

Access to Document

10.1109/MWSCAS.2013.6674598

Cite this

Pagliarini, S. N., Ban, T., De Naviner, L. A., & Naviner, J. F. (2013). Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis. In 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013 (pp. 113-116). Article 6674598 (Midwest Symposium on Circuits and Systems). https://doi.org/10.1109/MWSCAS.2013.6674598

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title = "Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis",

abstract = "This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63\% smaller for the studied circuits.",

author = "Pagliarini, \{Samuel N.\} and Tian Ban and \{De Naviner\}, \{Lirida A.\} and Naviner, \{Jean Francois\}",

year = "2013",

month = dec,

day = "1",

doi = "10.1109/MWSCAS.2013.6674598",

language = "English",

isbn = "9781479900664",

series = "Midwest Symposium on Circuits and Systems",

pages = "113--116",

booktitle = "2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013",

note = "2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013 ; Conference date: 04-08-2013 Through 07-08-2013",

}

Pagliarini, SN, Ban, T, De Naviner, LA & Naviner, JF 2013, Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis. in 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013., 6674598, Midwest Symposium on Circuits and Systems, pp. 113-116, 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, United States, 4/08/13. https://doi.org/10.1109/MWSCAS.2013.6674598

Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis. / Pagliarini, Samuel N.; Ban, Tian; De Naviner, Lirida A. et al.
2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013. 2013. p. 113-116 6674598 (Midwest Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - De Naviner, Lirida A.

AU - Naviner, Jean Francois

PY - 2013/12/1

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AB - This paper proposes two heuristic-based approaches for assessing the reliability of combinational logic in digital circuits. Both approaches take into account reconvergent signals but limited to a first-order-only analysis. Our results show that both approaches lead to more accurate results. Average estimation errors can be 63% smaller for the studied circuits.

U2 - 10.1109/MWSCAS.2013.6674598

DO - 10.1109/MWSCAS.2013.6674598

M3 - Conference contribution

AN - SCOPUS:84893200985

SN - 9781479900664

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Y2 - 4 August 2013 through 7 August 2013

ER -

Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis

Abstract

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Conference

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