Resonant Auger spectroscopy study of charge transfer phenomena in N 1s core-excited acetonitrile adsorbates on Si(0 0 1)-2 × 1

J. J. Gallet, F. Bournel, S. Carniato, G. Dufour, F. Rochet, S. Rangan, F. Sirotti

Research output: Contribution to journalArticlepeer-review

Abstract

Acetonitrile (CH3CN) adsorbs on Si(0 0 1)-2 × 1 at room temperature under two forms, a cycloaddition-like adduct (Si-C{double bond, long}N-Si) and a pendent cyano (Si-CH2-C{triple bond, long}N) resulting from the decomposition of the molecule. Resonant Auger spectroscopy has been used to study the excited-state-dependent electron transfer from the N 1s core-excited molecular adsorbate to the silicon substrate, using the core-hole lifetime (∼6 fs) as an internal clock. It is shown that the πC{double bond, long}N * NEXAFS state lies within the silicon bandgap because of a core-excitonic effect. Therefore no charge transfer of the excited electron to the substrate is observed. On the other hand the πC{triple bond, long}N * NEXAFS state is placed within the silicon conduction band. Excitation to this orbital leads to valence/Auger spectra in which both resonant and normal Auger contributions are observed. Therefore there is evidence for a charge transfer from the pendent C{triple bond, long}N to the silicon surface, on a timescale estimated to tens of femtoseconds.

Original languageEnglish
Pages (from-to)552-561
Number of pages10
JournalSurface Science
Volume601
Issue number2
DOIs
Publication statusPublished - 15 Jan 2007
Externally publishedYes

Keywords

  • Auger spectroscopy
  • Density functional calculations
  • Excitons and excited surface states
  • Femtosecond electron transfer
  • NEXAFS
  • Organo-functionalization of surfaces
  • Silicon
  • Synchrotron radiation photoelectron spectroscopy

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