Abstract
Resonant inelastic x-ray scattering (RIXS) involving selective excitations to Gd (Formula presented) intermediate states has been measured. An x-ray resonant Raman effect is clearly identified for excitation to states below the (Formula presented) ionization threshold. RIXS spectra have been calculated for several excitation energies and provide a good quantitative explanation for the large variation in the (Formula presented) branching ratio intensities observed as a function of excitation energy. Weak structure observed close to the elastic peak is identified as the result of spin-flip scattering.
| Original language | English |
|---|---|
| Pages (from-to) | R14238-R14241 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 54 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 1 Jan 1996 |
| Externally published | Yes |