Resonant inelastic x-ray scattering in gadolinium

J. J. Gallet, J. M. Mariot, C. Hague, F. Sirotti

Research output: Contribution to journalArticlepeer-review

Abstract

Resonant inelastic x-ray scattering (RIXS) involving selective excitations to Gd (Formula presented) intermediate states has been measured. An x-ray resonant Raman effect is clearly identified for excitation to states below the (Formula presented) ionization threshold. RIXS spectra have been calculated for several excitation energies and provide a good quantitative explanation for the large variation in the (Formula presented) branching ratio intensities observed as a function of excitation energy. Weak structure observed close to the elastic peak is identified as the result of spin-flip scattering.

Original languageEnglish
Pages (from-to)R14238-R14241
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume54
Issue number20
DOIs
Publication statusPublished - 1 Jan 1996
Externally publishedYes

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